CION Module™

The CION module is based on the CION™ interface chip also developed by GOEPEL Electronics, and can be accessed and controlled serially via TAP. It is an external boundary scan extension of the unit under test, which can be used to test peripheral I/O, connectors, backplanes, bases, etc.
You can easily cascade multiple modules with the same or different specifications to increase the number of channels. Currently, we provide four different versions of CION modules.

The CION module is based on the CION™ interface chip also developed by GOEPEL Electronics, and can be accessed and controlled serially via TAP. It is an external boundary scan extension of the unit under test, which can be used to test peripheral I/O, connectors, backplanes, bases, etc.
You can easily cascade multiple modules with the same or different specifications to increase the number of channels. Currently, we provide four different versions of CION modules.

The CION module is based on the CION™ interface chip also developed by GOEPEL Electronics, and can be accessed and controlled serially via TAP. It is an external boundary scan extension of the unit under test, which can be used to test peripheral I/O, connectors, backplanes, bases, etc.
You can easily cascade multiple modules with the same or different specifications to increase the number of channels. Currently, we provide four different versions of CION modules. The CION module is based on the CION™ interface chip also developed by GOEPEL Electronics, and can be accessed and controlled serially via TAP. It is an external boundary scan extension of the unit under test, which can be used to test peripheral I/O, connectors, backplanes, bases, etc.
You can easily cascade multiple modules with the same or different specifications to increase the number of channels. Currently, we provide four different versions of CION modules.

The CION module is based on the CION™ interface chip also developed by GOEPEL Electronics, and can be accessed and controlled serially via TAP. It is an external boundary scan extension of the unit under test, which can be used to test peripheral I/O, connectors, backplanes, bases, etc.
You can easily cascade multiple modules with the same or different specifications to increase the number of channels. Currently, we provide four different versions of CION modules.

The CION module is based on the CION™ interface chip also developed by GOEPEL Electronics, and can be accessed and controlled serially via TAP. It is an external boundary scan extension of the unit under test, which can be used to test peripheral I/O, connectors, backplanes, bases, etc.
You can easily cascade multiple modules with the same or different specifications to increase the number of channels. Currently, we provide four different versions of CION modules.